Investigation of Coupled Surface and Bulk Reaction Phenomena Using Combined-Backscatter-Conversion Electron and Backscatter-Photon Mossbauer Spectroscopy (CEAPS)
Abstract
A combined-backscatter-conversion electron and backscatter-photon Mossbauer spectrometer has been constructed and used in conjunction with new theoretical modeling efforts to examine a number of thin-film system. The spectrometer permits nondestructive depth-profiling from the topmost monolayer to as deep as 20 microns into the bulk and is ideal for examining the chemistry which occurs at buried-interfaces. Systems investigated include: (i) iron overlayers on mos2, (ii) FeTi-hydrides, (iii) Pd-coated FeTi-hydrides, (iv) ion- mixed FeSn interfaces and (v) atomic oxygen protective coatings on iron containing substrates. Results of these studies provide (i) adhesion, reaction and intercalation mechanisms of MoS2 on iron substrates, (ii) deactivation mechanisms for FeTi materials, (iii) protection of FeTi materials by Pd- overlayers, (iv) phase behavior, depth and compounds formed after ion beam mixing FeSn interfaces and (v) oxidation rates for FeAg substrates below Sio2 overlayers exposed to atomic oxygen. Keywords; Iron, Tin, Molybdenum disulfide, Iron molybdenum sulfide, Conversion electron; Depth profile; Nondestructive; Thin film.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 30, 1988
- Accession Number
- ADA200730
Entities
People
- Bruce J Tatarchuk
Organizations
- Auburn University