Design of a Wafer-Scale Focal Plane Processor

Abstract

This report describes a wafer-scale design for an infrared focal place processor (FPP) to operate in a space environment. The functions of a generic focal plane processor are described, followed by a detailed discussion of a design to be implemented in RVLSI wafer-scale technology for a space-based application. A prototype of this processor (PFPP) will actually be fabricated in rad-hard silicon-on-insulator 3-micrometers technology. Finally, the question of reliability is explored, and a philosophy of fault tolerance is presented which will lead to a reasonable probability of success over a five-year lifetime. Keywords include: Focal plane processor, Infrared detector, Wafer-scale integration, VLSI, Time-dependant Fault tolerance, and Image processors.

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Document Details

Document Type
Technical Report
Publication Date
Sep 15, 1988
Accession Number
ADA200937

Entities

People

  • P. C. Trepagnier

Organizations

  • Massachusetts Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Materials and Manufacturing Processes
  • Sensors

DTIC Thesaurus Topics

  • Accuracy
  • Algorithms
  • Detection
  • Detectors
  • Electronic Components
  • Electrons
  • Environment
  • False Alarms
  • Fault Tolerance
  • Focal Planes
  • Infrared Detectors
  • Probability
  • Reliability
  • Shift Registers
  • Space Based
  • Space Environments
  • Warning Systems

Readers

  • Image Processing and Computer Vision.
  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Space
  • Space - Space Objects