Effects of Heavy Ions on Microcircuits in Space: Recently Investigated Upset Mechanisms

Abstract

Upset of microcircuits in space have been attributed to heavy ions. In recent studies of the failure mechanisms, we have employed a wide range of test methods. These studies and the application of the test results to space-borne microcircuits are presented. Keywords: Cosmic ray damage; Microcircuits in space; Radiation effects; Single event upset; Space electronics.

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Document Details

Document Type
Technical Report
Publication Date
Oct 15, 1988
Accession Number
ADA201711

Entities

People

  • Rokutaro Koga
  • Wojciech A. Kolasinski

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Circuits
  • Classification
  • Complementary Metal-Oxide Semiconductors
  • Computer Programs
  • Corporations
  • Cosmic Rays
  • Detectors
  • Electronics Laboratories
  • Environment
  • Failure Mode And Effect Analysis
  • High Temperature
  • Logic
  • Logic Devices
  • Logic Gates
  • Relaxation Time
  • Semiconductor Devices
  • Semiconductors

Fields of Study

  • Physics

Readers

  • Aerospace Engineering.
  • Solar Physics

Technology Areas

  • Microelectronics
  • Space