Preparation of STM (Scanning Tunneling Microscopy) Tips for In-Situ Characterization of Electrode Surfaces
Abstract
The total current between the tip and the sample in a scanning tunneling microscopy study of a solid/liquid interface can be dominated by faradaic charge transfer currents. In such a situation feedback control of the tunneling gap, and imaging, is precluded. In this contribution we describe the preparation of glass or polymer coated STM tips that possess < 100 A2 of exposed metal. These tips effectively discriminate against faradaic current and enable STM imaging in the presence of reversible electroactive solution species at appreciable tip/sample biases. Electrochemistry, Tip preparation.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 28, 1988
- Accession Number
- ADA201868
Entities
People
- Calvin F. Quate
- Michael J. Heber
- Moris M. Dovek
- Nathan S. Lewis
- Reginald M. Penner
Organizations
- California Institute of Technology