Algorithmic Fault Tolerance
Abstract
A reduction in the minimum attainable feature size in integrated circuits has lead to the possibility of more and more complex circuits being built on a single chip (VLSI). This technological advance brings with it the need to make these circuits fault tolerant: to increase yield and reliability and to reduce testing times. This Memorandum briefly reviews current techniques for designing fault tolerant circuits before concentrating on a new, high-level fault tolerance technique: algorithmic fault tolerance. The concept of algorithmic fault tolerance is explained and various techniques are reviewed with regard to their suitability for providing fault tolerance for signal processing algorithms. Suggestions are made for the direction for further research.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1988
- Accession Number
- ADA202065
Entities
People
- I. K. Proudler
Organizations
- Royal Signals and Radar Establishment