An Experimental Method of Testing Thin-Film Heat Transfer Gages

Abstract

Thin film gages have been used successfully for measuring rapid temperature fluctuations in experiments with a time duration of a few milliseconds. For these short times, a one-dimensional, semi-infinite solid analysis may be used to convert surface temperatures into surface heat fluxes. However, two primary factors can cause inaccurate results: (1) gage preheating due to electrical currents in the gage, and (2) extended test times which allow two-dimensional effects to invalidate the use of the one-dimensional model. The objectives of this thesis are the determination of test time and electrical current limitations of thin-film heat transfer gages. Heat Transfer, Thin film gages, Preheating, Two dimensional effects, Theses.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1988
Accession Number
ADA202605

Entities

People

  • Gerald W. Wirsig

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Boundary Layer
  • Climate Change
  • Computer Programs
  • Engineering
  • Films
  • Heat Flux
  • Heat Transfer
  • Heat Transfer Coefficients
  • Mass Transfer
  • Materials
  • Mechanical Properties
  • Stagnation Pressure
  • Surface Temperature
  • Temperature Gradients
  • Thin Films
  • Two Dimensional

Readers

  • Computational Modeling and Simulation
  • Mechanical Engineering/Mechanics of Materials.
  • Thermal Physics or Thermal Science.