Hydrogen Segregation to Grain Boundaries and External Surfaces

Abstract

Segregation of hydrogen to grain boundaries, surfaces and defects has been studied in Nb, Nb - V alloys, and Ni using Secondary Ion Mass Spectrometry. This technique has been shown capable of determining the distribution of hydrogen at interfaces under suitable experimental conditions. Very large segregation enhancements are shown for surfaces and grain boundaries. The enhanced concentrations extend for significant distances from the surfaces. Secondary Ion Mass Spectrometry (SIMS) is one of the very few techniques capable of determining the distribution of hydrogen and its isotopes on a microscopic scale /1,2,3,4/. Due to the complexity of the instrumentation and the experimental variables care must be taken to ensure that measurement artifacts do not interfere with the determinations. Generally, only qualitative analysis can be carried out unless internal standards are available; as is the case in many hydride forming systems. In the present paper a review of some of the necessary experimentally conditions will presented/1/and the results of applying the technique to hydrogen distributions in Nb - V alloys and Ni will be presented.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1988
Accession Number
ADA202892

Entities

People

  • B. Ladna
  • E. Sirois
  • Howard K. Birnbaum

Organizations

  • University of Illinois Urbana–Champaign

Tags

DTIC Thesaurus Topics

  • Auger Electron Spectroscopy
  • Auger Electrons
  • Boundaries
  • Crystal Lattices
  • Crystal Structure
  • Electron Spectroscopy
  • Elements
  • Grain Boundaries
  • Hydrogen
  • Ion Beams
  • Low Temperature
  • Mass Spectrometry
  • Materials
  • Materials Science
  • Measurement
  • Spectrometry
  • Spectroscopy

Fields of Study

  • Physics

Readers

  • Fluid Dynamics.
  • Materials Science and Engineering.
  • Thin Film Deposition Science.