Low Cycle Fatigue of Surface Mounted Chip Carrier/Printed Wiring Board Joints

Abstract

Chip carrier/printer wiring board joints have been tested isothermally, at 35 C, in shear. The joints were subjected to fully reversed cycling with fixed plastic displacement limits. The fatigue life was correlated to this displacement by a pseudo Coffin-Manson law. The fatigue life was defined in terms of a 25%,50%,90%, and 100% drop in the load required to produce a given displacement. The resistance of each of 22 joints was also measured and Nf defined in terms of the first joint to increase by 0.02%,0.05%,0.1%,10%,100%, and 10X. The results were found to be in general agreement with those obtained previously on single, larger, solder joints. Some variations were noted in the Coffin-Manson exponent, depending on how the displacement and fatigue lives were defined. This was discussed along with a descriptive model describing the process of joint fatigue. A set of displacement vs. fatigue life curves is provided, which can be used to determine the joint life based upon a variety of criteria.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1987
Accession Number
ADA204191

Entities

People

  • H. D. Solomon

Organizations

  • Martin Marietta

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Aeronautical Laboratories
  • Air Force
  • Circuit Boards
  • Circuits
  • Displacement
  • Elastic Properties
  • Fatigue Cracking
  • Fatigue Life
  • Fatigue Tests (Mechanics)
  • Materials
  • Materials Laboratories
  • Measurement
  • Printed Circuit Boards
  • Printed Circuits
  • Resistance
  • Strain Rate
  • Thermal Fatigue

Readers

  • Electrical Engineering
  • Materials Science (Mechanical Engineering).
  • Structural Dynamics.