(1+1) Resonant Enhanced Multiphoton Ionization Via the A 2 Sigma(+) State of NO: Ionic Rotational Branching Ratios and Their Intensity Dependence

Abstract

Recent high resolution photoelectron spectroscopic studies of the (1+1) resonant enhanced multiphoton ionization (REMPI) of Nitrogen Oxide via the 0-0 transition of the A-X band (gamma band) have shown a pronounced delta N=O signal (delta N=N+-Ni) and smaller, but measurable, delta N= + or - 2 peaks. The authors K. S. Viswanathan et al., J. Phys. Chem., 90, 5078 (1986) assign the excitation to be via an R(21.5) line, with no further specification. We have performed ab initio calculations of the rotational branching ratios for the four possible R(21.5) transitions, namely, the rotationally clean R21 and R22, and the mixed R12+Q22 and R11+Q21 branches. We find the mixed R12+Q22 (21.5) branch to agree best with the observed photoelectron spectrum collected parallel to the polarization vector of the light. The discrepancy is larger for detection perpendicular to the polarization. To understand this difference, we have assessed the influence of laser intensity and polarization contamination on the branching ratios and photoelectron angular distributions. Reprints.

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Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1988
Accession Number
ADA205033

Entities

People

  • H. Rudolph
  • S. N. Dixit
  • V. Mckoy
  • W. M. Huo

Organizations

  • California Institute of Technology

Tags

Communities of Interest

  • Biomedical

DTIC Thesaurus Topics

  • Agreements
  • Angular Momentum
  • Detection
  • Energy
  • Equations
  • Excitation
  • High Resolution
  • Intensity
  • Ionization
  • Light Sources
  • New York
  • Nitrogen Oxides
  • Photoelectron Spectra
  • Photoelectrons
  • Quantum Numbers
  • Spectra
  • Total Angular Momentum

Fields of Study

  • Physics

Readers

  • Molecular Photonics/Laser Physics
  • Quantum Chemistry

Technology Areas

  • Directed Energy
  • Directed Energy - Lasers
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics