Proceedings of the Very Low Frequency (VLF) Ambient Noise Workshop Held in Stennis, Mississippi on 20-21 September 1988

Abstract

A significant number of measurements of acoustic and ambient noise environmental data have been made over the past 15 years. Unfortunately, the processing, analysis, and reporting of these measurements have not been pursued at a commensurate level. It seems that there are always more funds available for measurement than for analysis. Hence, it is reasonable to assume that present data which have not received complete processing attention may contain some undiscovered gems that could be extremely valuable to a current program. Furthermore, these gems may be 'mined' at relatively low lost compared to the cost of fielding an experiment to reacquire the data. The key, of course, is to scrutinize the data very closely to determine if the potential for gems existing in the data is high, the quality of the storage medium is adequate, and the necessary ancillary information is available. This includes deployment logs, environmental measurements, and descriptions of measurement conditions that include factors influencing the processing and analysis of the data. An additional consideration, some corporate knowledge must still exist concerning the data. These concerns were the motivating factors for conducting this VLF ambient noise workshop.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1988
Accession Number
ADA205148

Entities

People

  • Laurie A. Jugan
  • Marshall R. Bradley
  • Ronald A. Wagstaff

Organizations

  • United States Naval Research Laboratory

Tags

Communities of Interest

  • Ground and Sea Platforms

DTIC Thesaurus Topics

  • Acoustic Detectors
  • Acoustic Propagation
  • Acoustic Waves
  • Acoustics
  • Ambient Noise
  • Boundary Layer
  • Corporations
  • Databases
  • Detection
  • Filtration
  • Flow Noise
  • Frequency
  • Gain
  • Measurement
  • Seabed
  • Self Noise
  • Very Low Frequency

Readers

  • Acoustical Oceanography.
  • Systems Analysis and Design