A Microwave Measurement Technique for Complex Constitutive Parameters

Abstract

A technique was developed for the measurement of complex constitutive parameters of thin slabs of radiation absorbing material. Parameters include the real and imaginary components of the permittivity and permeability. The conductivity was lumped into a composite imaginary permittivity component through the loss tangent. The homogeneity of the material across the slab's surface and the ability of this technique to locate areas where the parameters deviate from the average was also examined. The transmission coefficients of the slabs were measured at several angles of incidence using a 180 degree, bistatic configuration. This permitted a computer program to solve the nonlinear system of transmission equations for the desired parameter values. The technique and computer program are applicable to measurements taken at either perpendicular or parallel polarization, and takes advantage of prior known material qualities, nonmagnetic or lossless, to reduce the order of the system. Measurements were taken at 94 GHz using a Gunn phase-locked oscillator as a source. A pair of conical horn-lens antennas and a Scientific Atlanta 1783 Programmable microwave receiver were the primary pieces of equipment required. Theses.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1988
Accession Number
ADA206007

Entities

People

  • Michael J. Walker

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Angle Of Incidence
  • Computer Programs
  • Computers
  • Electrical Engineering
  • Electromagnetic Radiation
  • Equations
  • Far Field
  • Materials
  • Measurement
  • Microwaves
  • Near Field
  • Nonlinear Systems
  • Radiation
  • Scattering
  • Standing Waves
  • Time Domain

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Plasma Physics / Magnetohydrodynamics
  • Spectroscopy.