On-Orbit Observations of Single-Event Upset in Harris HM-6508 RAMSs (Random Access Memories): An Update
Abstract
The single event upset (SEU) phenomenon has continued to be of great interest to designers of spaceflight hardware. Although a great deal of ground testing has been and continues to be carried out, quantitative on-orbit measurements are very limited. Space measurements are a key part of the effort to ensure that the ground-based testing yields accurate predictions of on-orbit upset rates. Blake and Mandel have published data from two years of flight observations from a subsystem consisting of 384 Harris HM-6508 1K RAMs. This report is an update of that study; the results of 2560 days of observation are presented. A total of 234 SEUs were observed during 2560 days of observation. Thus, the average upset rate per day is (2.62 + or - 0.17) x .0000007 upsets/bit day.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 16, 1989
- Accession Number
- ADA206266
Entities
People
- J. B. Blake
- R. Mandel
Organizations
- The Aerospace Corporation