In Situ Mechanistic Studies of MOCVD(Metal Organic Chemical Vapor Deposition) Growth of 3/5 Semiconductors

Abstract

Our initial studies of metal organic chemical vapor deposition for the growth of III-V semiconductors have developed in situ techniques to follow the growth process both in the gas phase and in the on the surface (in the sorbed state). The results have provided a more direct perspective of the mechanisms and kinetics of the reaction between group V alkyls and group III hydrides. Both Fourier transform infrated spectroscopy (FTIR) and detailed surface spectroscopy have been employed to study the course of the reaction and the nature of the solid products. We conclude that the crucial steps of the reaction. Occur on the surface of the solid substrate. Although gas phase decomposition of the group V organometallic occurs, the reactions leading to the formation of III-V bonds proceed on the surface. This leads us to focus on the availability of adsorbed atomic hydrogen as it relates to the removal of alkyls from the group V metal organic in the continuation of this research.

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Document Details

Document Type
Technical Report
Publication Date
Feb 07, 1989
Accession Number
ADA206396

Entities

People

  • William C. Conner

Organizations

  • University of Massachusetts Amherst

Tags

DTIC Thesaurus Topics

  • Adsorption
  • Auger Electron Spectroscopy
  • Auger Electrons
  • Chemical Engineering
  • Chemical Vapor Deposition
  • Classification
  • Engineering
  • Heat Transfer
  • Kinetics
  • Materials
  • Reaction Mechanisms
  • Semiconductors
  • Spectra
  • Spectroscopy
  • Surface Analysis
  • Surface Reactions
  • Vapor Deposition

Fields of Study

  • Materials science

Readers

  • Electrochemical Engineering/ Fuel Cell Technologies
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene