High-Fill-Factor 160 x 244-Element and 320 x 244-Element PtSi Schottky- Barrier IR-CCD Image Sensors

Abstract

Two high-fill factor IR-CCD imagers, with PtSi Schottky-barrier detectors, were successfully demonstrated. The 160-element x 244-element imager has 80 micron x 40 micron pixels, with a fill factor of 60%, and a saturation signal of up to 2,500,000 electrons/pixel. For operation with a 300-K background, 30 frame/s, f/2.35 cold shield, and a 3.4 micron long-pass filter, a noise equivalent temperature (NE Delta T) of 0.04 C was measured for this imager. The 320-element x 244-element imager has 40 micron x 40 micron pixels, a fill factor of 43%, and a saturation signal of up to 1.5 x 10 to the 6th power electrons/pixel. For operation with a 300K background, 30 frames/s, and f/2.0 cold shield, a shot-noise-limited NE Delta T of 0.038 C was measured for this imager. Both of the above imagers show no loss of horizontal and vertical resolution due to charge-transfer inefficiency for operation of the serial output register with a 2-phase CCD clock. This report describes the design, processing, operation and performance of the new 160 x 244 and 320 x 244 IR-CCD imagers.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1988
Accession Number
ADA206822

Entities

People

  • F. V. Shallcross
  • G. M. Meray
  • Rachel A. Miller
  • T. S. Villani
  • W. F. Kosonocky

Organizations

  • Sarnoff Corporation

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Charge Coupled Devices
  • Charge Transfer
  • Classification
  • Construction
  • Detectors
  • Diffusion
  • Digital Images
  • Electronics
  • Electrons
  • Fabrication
  • Focal Plane Arrays
  • Focal Planes
  • Guard Rings
  • Images
  • Materials
  • Saturation
  • Shot Noise

Fields of Study

  • Physics

Readers

  • Image Processing and Computer Vision.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics