FD-TD (Finite-Difference Time-Domain) Scattering from Apertures
Abstract
This report studies the application of a popular numerical technique, the Finite Difference Time Domain (FDTD) technique to the problem of scattering by conductor-backed dielectric plates, with cracks in the dielectric. Although previous efforts have only dealt successfully with frequencies that are relatively high, the technique presented in this report is applicable at low frequencies (i.e., where the crack is small with respect to wavelength). The formalism presented requires a relatively minor change in the basic FDTD technique. The first section presents a brief overview of some electromagnetic numerical techniques as applied to dielectric structures. This is followed by an introductory section on the basics of the FDTD technique. Next, the FDTD technique is extended so that it can model thin dielectric sheets. This is followed by a discussion of the extension of the FDTD technique to conductor- backed dielectric sheets. Finally, the complete model of conductor-backed dielectric sheets with cracks is presented. Cracks, Gaps, Numerical methods, Scattering.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1988
- Accession Number
- ADA206823
Entities
People
- Kenneth R. Demarest
Organizations
- University of Kansas