Electron-Impact Ionization Time-of-Flight Mass Spectrometer for Molecular Beams,
Abstract
A method is described for performing electron impact ionization time of flight mass spectrometry in a molecular beam apparatus. The method is a convenient way to optimize the performance of pulsed or continuous nozzle sources and can be used in conjunction with laser excitation. Mass spectra are produced either as analog waveforms or in a high repetition rate ion counting mode. The device can also be operated as a fast ionization guage for time resolved detection of pulsed beams. Electron impact ionization, Molecular beams, Time of flight, Mass spectrometer. (mjm)
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 15, 1989
- Accession Number
- ADA207585
Entities
People
- James E. Pollard
- Ronald B. Cohen
Organizations
- The Aerospace Corporation