Discrete Semiconductor Device Reliability

Abstract

The objective of this publication is to update the discrete semiconductor device reliability data and information currently available to the reliability community. Field and test failure data are presented in detailed and summarized formats on state-of-the-art transistors, diodes, and optoelectronic devices. Significant issues with respect to discrete semiconductor device reliability are investigated including the validity of the exponential time to failure distribution, the effect of technological advances on device reliability, and the effects of electrical parameter derating. In addition, failure mode and mechanism data is presented for transistors, diodes, liquid crystal displays and photovoltaic cell array modules.

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Document Details

Document Type
Technical Report
Publication Date
Mar 25, 1988
Accession Number
ADA208360

Entities

People

  • Mary G. Priore

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Crystal Structure
  • Current Regulators
  • Diodes
  • Electronic Components
  • Electronic Equipment
  • Electronics Industry
  • Electronics Laboratories
  • Failure Mode And Effect Analysis
  • Field Effect Transistors
  • Integrated Circuits
  • Laser Diodes
  • Liquid Crystal Displays
  • Modules (Electronics)
  • Optoelectronic Devices
  • Optoelectronics
  • Semiconductor Devices
  • Semiconductors

Fields of Study

  • Engineering

Readers

  • Business Analytics
  • Integrated Circuit Design and Technology.
  • Statistical inference.

Technology Areas

  • Microelectronics