Electrical Characterization of Signal Processing Microcircuit

Abstract

The objective of this effort is to conduct characterization efforts for analog integrated circuit device types for inclusion into the MIL-M-38510 specification system (General Specification for Microcircuits). The effort includes determination of a devices's parameters and its limits as well as static and dynamic test circuits to verify these limits. All of the characterization and specification efforts performed are guided by the fundamental objectives of MIL-M-38510 specification system which are to achieve quality, reliability, interchangeability, and standardization of microcircuits procured for use in military systems. The scope of the effort includes electrical characterization of the following device types: a. AD534, AD532, 4213VM analog multipliers, b. 180 J-FET analog switch series, c. 200, 300, 5040 CMOS analog switch series, d. 506-509, 506A-509A CMOS multiplexer series, e. 2000 darlington transistor array series, f. 1524, 1525, 1526, 1527 regulating pulse width modulators, and g. TL431 shunt regulating reference.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1989
Accession Number
ADA209078

Entities

People

  • Daniel F. Fayette
  • Nancy A. Koziarz

Organizations

  • Rome Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Bench Tests
  • Circuits
  • Dynamic Tests
  • Electronic Circuits
  • Electronics Industry
  • Field Effect Transistors
  • Integrated Circuits
  • Life Tests
  • Pulse Generators
  • Reliability
  • Semiconductors
  • Signal Generators
  • Signal Processing
  • Static Tests
  • Test And Evaluation
  • Test Equipment
  • Test Methods

Fields of Study

  • Engineering

Readers

  • Integrated Circuit Design and Technology.

Technology Areas

  • Microelectronics