Mode Matching Analysis of the Coplanar Microstripline on a Layered Dielectric Substrate

Abstract

In this project, mode matching was used to calculate the propagation constant and the characteristic impedance of a coplanar coupled microstrip line. The Striplines are considered to be perfect electric conductors of negligible thickness, and are separated from the ground plane by three layers of dielectric material. The layer with the higher dielectric constant is sandwiched between two layers of lower dielectric constants, such that the field is confined to this middle layer, which is called the 'conducting layer' of the microstrip line. By confining the field to this layer, losses at the metal conductor are minimized.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1989
Accession Number
ADA209403

Entities

People

  • Afroditi V. Filippas
  • Tatsuo Itoh

Organizations

  • University of Texas at Austin

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Cartesian Coordinates
  • Dielectric Permittivity
  • Dielectrics
  • Dispersion Relations
  • Electric Fields
  • Electrical Engineering
  • Electromagnetic Fields
  • Equations
  • Flux Density
  • Helmholtz Equations
  • Magnetic Fields
  • Military Research
  • Notation
  • Planar Structures
  • Security
  • Transmission Lines
  • Voltage

Fields of Study

  • Physics

Readers

  • Fluid Dynamics.
  • Microwave Engineering.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene