Attenuated Total Reflection FTIR Spectroscopy for Measuring Interfacial Reaction Kinetics at Silica Surfaces

Abstract

Attenuated total reflection (ATR) spectroscopy has been adapted to measure the rates of chemical reactions which modify silica surfaces. In this method, a silicon ATR substrate is oxidized to produce a silicon dioxide surface layer, which can be used as a model silica surface in measurements of the rates chemical modification. An ATR flow cell is filled with a solution of a surface active reagent, and spectra are obtained at regular intervals. Confinement of the infrared intensity to the interface by total internal reflection provides a measure of changes in concentrations of species which adsorb or bind to the surface.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1989
Accession Number
ADA210314

Entities

People

  • D. B. Parry
  • J. M. Harris

Organizations

  • University of Utah

Tags

DTIC Thesaurus Topics

  • Carbon Tetrachloride
  • Chemical Compounds
  • Chemical Kinetics
  • Chemical Reactions
  • Chemical Synthesis
  • Chemistry
  • Composite Materials
  • Films
  • Infrared Spectra
  • Kinetics
  • Materials Science
  • Military Research
  • Radiation
  • Silicon Dioxide
  • Spectra
  • Spectroscopy
  • Surface Reactions

Fields of Study

  • Chemistry

Readers

  • Spectroscopy.
  • Surface Coatings Technology.