Precision Materials Characterization in the Near Millimeter and Submillimeter Wavelength Range
Abstract
Laser-based instrumentation which employs quasi-optical techniques to measure near millimeter wave dielectric properties has been developed in this laboratory and successfully used to acquire a data base on a wide variety of materials. This report includes the results for various crystalline and non- crystalline solids, semiconductor, and samples of various standard and advanced ceramics. Measurements are at 245 GHz and the results are compared with the data obtained by other researchers on similar samples. Near millimeter waves; Optically pumped molecular laser; Crystal sapphire; Alumina; Quartz and fused silica; Silicon; Boron nitride; Silicon nitrides; Beryllia & nickel ferrites.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1989
- Accession Number
- ADA210655
Entities
People
- Charles R. Jones
- Jyotsna M. Dutta
Organizations
- North Carolina College