International Workshop on Beam Injection Assessment of Defects in Semiconductors Held in Meudon-Bellevue (France) on 18-20 July 1988

Abstract

Contents: SEM microcharacterization of semiconductors; Electron and photon-matter interaction; Modelling of the EBIC measurements of diffusion lengths and the recombination contrast; Minority carrier diffusion length: measurement; STEM-catholuminescence; Intrinsic or extrinsic origin of the recombinations at defects; LBIC quantitative mapping; Scanning DLTS; CL in laser heterojunctions; CL in quantum-wells; Electron and optical beam testing of integrated circuits. (rh)

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Document Details

Document Type
Technical Report
Publication Date
Jul 20, 1989
Accession Number
ADA210842

Entities

People

  • A. Laugier
  • C. Donolato
  • D. S. Holt
  • Eliahu Napehan
  • Jean-philippe Collin
  • Jennifer Blain Christen
  • M. Kittler
  • O. Breitenstein
  • P. Henoc

Organizations

  • National Center for Scientific Research

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Band Gaps
  • Crystal Structure
  • Crystallography
  • Crystals
  • Detection
  • Electronics Industry
  • Electronics Laboratories
  • Energy Bands
  • Fermi Levels
  • Materials
  • Materials Science
  • Metal-Semiconductor Junctions
  • Modules (Electronics)
  • Power Electronics
  • Semiconductors
  • Solid State Physics
  • Two Dimensional

Fields of Study

  • Materials science

Readers

  • Academic Conference Management
  • Semiconductor Device Technology
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Directed Energy - Lasers
  • Microelectronics
  • Quantum Computing