Analysis of Carbon Fiber's X-Ray Microscopic Structure

Abstract

In this paper, we have used the X-ray diffraction method (including the small angle scatter method) to study the microscopic structure of four kinds of carbon fibers. We include the measurement of interlayer distance C for random-layer graphite, average height L of layer surface stacks, average width L of layer surfaces, degree of orientation W1/2, and carbon fiber's average microscopic holes. We also propose a calculation procedure for handling small angle scattering. Translation; China; Chinese language.

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Document Details

Document Type
Technical Report
Publication Date
Aug 16, 1989
Accession Number
ADA212215

Entities

People

  • Liu Changlin
  • Wang Jiarong
  • Yang Yuxing

Organizations

  • National Air and Space Intelligence Center

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Carbon Fibers
  • Chinese Language
  • Composite Materials
  • Crystal Structure
  • Crystals
  • Diffraction
  • Diffraction Analysis
  • Fibers
  • Foreign Technology
  • Geometry
  • Graphitic Materials
  • Measurement
  • Scattering
  • Spectra
  • Thickness
  • X Rays
  • X-Ray Diffraction

Readers

  • Nanofabrication and Microfabrication.
  • Optical Physics and Photonics.
  • Solar Physics