The Growth of Epitaxial GaAs and GaAlAs on Silicon Substrates by OMVPE

Abstract

This report covers the reporting period September to November 1988, quarter 9 in the program. Further heteroepitaxial and homo-epitaxial FET structures have been grown and assessed. CV profiles and mesa isolation tests have revealed difficulties in obtaining GaAs buffer layers with sufficiently high resistance to provide adequate mesa isolation to enable FETs to be processed to completion. A Further series of silicon substrates have been submitted for processing to give linear features orientated in the 110, 010 and 100, directions.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1989
Accession Number
ADA212873

Entities

People

  • D. J. Stirland
  • D. J. Warner
  • J. A. Beswick
  • P. Kightley
  • R. R. Bradley

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Auger Electron Spectroscopy
  • Auger Electrons
  • Diffraction
  • Electron Spectroscopy
  • Energy Bands
  • Epitaxial Growth
  • Etching
  • Fabrication
  • Field Effect Transistors
  • Low Temperature
  • Manufacturing
  • Materials
  • Microscopy
  • Selective Laser Sintering
  • Spectra
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology
  • Technical Research and Report Writing.