Standard Method for Measurement of Nonvolatile Residue on Surfaces

Abstract

Contamination analyses are used to determine if material, components, and subsystems can be expected to meet the performance requirements of a system. Of particular concern is the quantity of molecular contaminants which might be deposited on critical payload surfaces from these sources. This would include all time periods from fabrication, through loading into the vehicle, launching, and during the lifetime of the spacecraft in orbit. A method for determining the mass of nonvolatile residue (NVR) was generated at The Aerospace Corporation by the authors, and the procedure was accepted by the ASTM as Standard E1235, in May 1988. The standard applies to the mass of NVR deposited on 1-sq-ft witness plates exposed in clean rooms, clean work areas, and clean enclosures. This report describes a wipe method for collecting molecular contaminants from any surface and procedures for gravimetric analysis of the NVR so obtained.

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Document Details

Document Type
Technical Report
Publication Date
Aug 10, 1989
Accession Number
ADA213324

Entities

People

  • Ethel J. Watts
  • Eugene N. Borson
  • Gloria A. To

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Biomedical

DTIC Thesaurus Topics

  • Chemical Synthesis
  • Chemistry
  • Health Services
  • Material Degradation Processes
  • Materials Laboratories
  • Materials Processing
  • Materials Science
  • Materials Testing
  • Medical Personnel
  • Methanols
  • Organic Chemistry
  • Physics Laboratories

Readers

  • Environmental Engineering.
  • Software Engineering
  • Surface Coatings Technology.

Technology Areas

  • Space