Scanning Tunneling Microscope Studies of Surface Defects
Abstract
Experiments proposed for our UHV Scanning Tunneling Microscope systems focus on the study of surface roughness and defect formation. The objective is to study the formation of surface defects of the nature where surface crystalline structure is maintained but periodicity is not. Two complementary systems will be studied, one where defects are thermodynamically produced on stepped vicinal surfaces of silver, and a second system where epitaxial growth - surfaces grown using a commercial molecular beam epitaxy (MBE) apparatus - on GaAs substrates produces kinetically induced surface roughness. STM as a real space measure can probe defect type and distributions, information not available to surface diffraction techniques which measure a complementary value of averaged surface disorder. Interest is in the study of the energetics of these processes, both of which have important technological implications. This report will describe the current state of development of our experimental instrumentation and its planned completion. Following that is a discussion of the results obtained so far in the development of our STM. (JHD)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 16, 1989
- Accession Number
- ADA214121
Entities
People
- Kevin E. Johnson
- Thomas Engel
Organizations
- University of Washington