Observation of Atomic Relaxation Near an Interface through Detection of Emitted Fluorescence
Abstract
In this Comment we discuss the general features of spontaneous decay of an atom which is close to the surface of a dielectric (or metal) layer, and this is compared to atomic decay near a four-wave mixing phase conjugator. It is pointed out that the decay or relaxation constants can be expressed entirely in terms of the classical Fresnel coefficients for reflection and transmission of a plane wave, independent of what the explicit forms of these coefficients are. For decay near a dielectric the relaxation constants can be measured directly by counting the number of fluorescent photons per unit of time, after excitation by a laser. For relaxation near a phase conjugator this procedure would require a spectral resolution in the photon detection, since there are two distinct contributions to the fluorescent yield of a two-state atom. The two possible decay mechanisms have different relaxation constants and produce radiation with different frequencies. Atomic relaxation, Near an interface, Emitted fluorescence, Classical fresnel coefficients, Phase conjugator, Four-wave mixing. (jes)
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 1989
- Accession Number
- ADA214308
Entities
People
- Henk F. Arnoldus
- Thomas F. George
Organizations
- University at Buffalo