Boolean Approaches in Digital Diagnosis

Abstract

The goal of this thesis is to review and improve two existing methods that use Boolean reasoning as a basis for testing digital circuits. Extensions are made to research done by both Cerny and Kainec in this area. The method developed by Cerny to generate test vectors capable of detecting single stuck- at, bridge and multiple stuck-at faults is reviewed and then extended in two ways. The first extension incorporates the capability to automatically analyze the results gained from applying a given vector. The second extension allows the diagnosis of sequential circuits. Since Cerny's original method was not automated the entire process is updated to include the extensions and then programmed. Kainec developed an automated diagnostic system to test for multiple faults in combinational circuits. The original system is restricted to diagnosing faults in circuits with one output. An extension is designed and programmed to incorporate the capability to diagnose multiple output circuits. The extension shows that multiple output circuits offer the added advantage of being able to choose an optimal test vector from a set of generated vectors, thereby shortening the required testing time for a given circuit. The software routines are programmed in PC-Scheme (a dialect of LISP) on an IBM microcomputer. Due to a conversion program written by Kainec the software can also be run on a Sun-4 workstation in the T environment. T is derived from Scheme. (jhd)

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Document Details

Document Type
Technical Report
Publication Date
Dec 04, 1989
Accession Number
ADA215660

Entities

People

  • Reginald H. Gilyard

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Adaptive Systems
  • Air Force
  • Algorithms
  • Boolean Algebra
  • Circuit Analysis
  • Circuit Testers
  • Circuits
  • Computer Programming
  • Computers
  • Conversion
  • Digital Circuits
  • Engineering
  • Integrated Circuits
  • Logic
  • Logic Gates
  • Networks
  • Very Large Scale Integration

Fields of Study

  • Engineering

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