Light Scattering Studies of Far Infrared Dielectric Properties of Semiconductors

Abstract

The main objective of this project was to characterize the linear and non-linear infrared optical properties of technically important semiconductors in varied sample geometries, such as bulk, near a surface and in film geometry. Surface polaritons and guided-wave polaritons in GaP and GaSe were studied by Raman scattering spectroscopy. Resonance Raman effects were investigated at the indirect gap of Ga P. The structure of amorphous Se-Ge glass was determined by Raman scattering. A double grating spectrometer and a Fabry-Perot interferometer were interfaced to an LSI-II minicomputer using a CAMAC system. Keywords: Infrared radiation; Infrared phenomena. (kt)

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Document Details

Document Type
Technical Report
Publication Date
Apr 14, 1982
Accession Number
ADA215864

Entities

People

  • S. Ushioda

Organizations

  • University of California, Irvine

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • California
  • Electromagnetic Radiation
  • Fabry Perot Interferometers
  • Films
  • Interferometers
  • Light Scattering
  • Materials
  • Materials Science
  • Polaritons
  • Radiation
  • Raman Scattering
  • Resonance
  • Roughness
  • Scattering
  • Spectroscopy
  • Surface Roughness
  • Thin Films

Fields of Study

  • Materials science
  • Physics

Readers

  • Materials Science and Engineering.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Spectroscopy.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene