Fault Tolerant VLSI Design Assessments for Advanced Avionics Department

Abstract

With the advances in VLSI technology, it will be possible to fabricate chips with 100,000 to 500,000 gates per chip. Rather the technology to pack more and more elements on a chip has outpaced the collective knowledge for effective use of chip real estate. For example, it is virtually impossible to test high density microcircuits. This report reviews the existing literature on VLSI technology with regards to proposed methods to increase reliability and testability. One of the critical problems of high density microcircuits is the limited number of I/O pins. The present literature points out the two types of integrated circuit additions that can improve circuit reliability. The reports also provide a list of references for further study of Fault-Tolerant Computing. (KR)

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Document Details

Document Type
Technical Report
Publication Date
Feb 06, 1982
Accession Number
ADA216180

Entities

People

  • Robert A. Alexander
  • Satinderpaul S. Devgan

Organizations

  • Tennessee State University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Circuits
  • Electrical Engineering
  • Electronics
  • Engineering
  • Fabrication
  • Failure Mode And Effect Analysis
  • Fault Tolerance
  • Fault Tolerant Computing
  • High Density
  • Integrated Circuits
  • Large Scale Integration
  • Reliability
  • Semiconductor Devices
  • Semiconductors
  • Test Methods
  • Very Large Scale Integration

Fields of Study

  • Engineering

Readers

  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics