The Effect of Elevated Temperature on Latchup and Bit Errors in CMOS devices

Abstract

Equipment for testing microcircuits at elevated temperatures for Single Event Phenomena (SEP) such as upset (SEU) and latchup (SEL) has been developed, and measurements on several device types have been performed. Very large changes in cross section and threshold Linear Energy Transfer (LET) have been observed over the temperature range of 25 C to 120 C for SEU and SEL.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Nov 28, 1989
Accession Number
ADA216310

Entities

People

  • E. Schnauss
  • J. Duffey
  • Rokutano Koga
  • W. A. Kolasinski

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Space

DTIC Thesaurus Topics

  • Air Force
  • Air Force Facilities
  • Automatic
  • Availability
  • Circuits
  • Classification
  • Corporations
  • Cyclotrons
  • High Temperature
  • Instrumentation
  • Resistors
  • Security
  • Shift Registers
  • Space Sciences
  • Space Systems
  • Temperature Coefficients
  • Test Methods

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Spectroscopy.

Technology Areas

  • Microelectronics