Image Analysis Program for Measuring Particles with the Zeiss CSM 950 Scanning Electron Microscope (SEM)

Abstract

A menu-type computer program for stereological particle measurement was written for use with a Zeiss CSM 950 Scanning Electron Microscope (SEM) having a built-in Kontron image analyzer. The program enables the user to perform a variety of parameter measurements from external sources such as a light microscope or video camera. Carbon particles measurement; Spheres; Computer programs/menu. Statistical analysis.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1990
Accession Number
ADA217304

Entities

People

  • Abram King
  • Deborah Sakelakos
  • Samuel H. Cohen

Organizations

  • United States Army Soldier Systems Center

Tags

Communities of Interest

  • Cyber
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Abstracts
  • Cameras
  • Classification
  • Computer Programs
  • Computers
  • Electron Microscopes
  • Electrons
  • Image Processing
  • Measurement
  • Microscopes
  • Particles
  • Scanning
  • Scanning Electron Microscopes
  • Security
  • Statistical Data
  • Video
  • Video Cameras

Fields of Study

  • Physics

Readers

  • Aerosol Science/Aerosol Physics
  • Computer Science.
  • Nanoscale Plasmonic Nanotechnology

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems