The Feasibility of Event Sequence Discrimination for the Improvement of Gamma-Ray Spectrometer Sensitivity

Abstract

Nuclear measurement applications for military surveillance, environmental monitoring, and physics research are bounded by detection sensitivity and counting time limitations. To date, improvements in detection sensitivity for semiconductor detectors have been limited to small incremental gains made primarily through increased crystal size and purity. The results of this study indicate that a step improvement in the gamma ray detection sensitivity of semiconductor detectors is achievable if information on each scattering sequence can be processed and used on a livetime basis to accept preferentially the full energy event sequences, and to reject 'false' partial energy event sequences. In this study, a Monte Carlo model for gamma ray interactions in germanium was developed and used to select criteria on interaction location and number of events which are predicted to improve detector performance. The sensitivity of a detector system was determined from the Monte Carlo model results for five gamma ray energies in the range 88 keV to 1836 keV, under several event discrimination criteria. Keywords: Semiconductor radiation detectors; Gamma-ray spectrometer; Radiation monitoring.

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Document Details

Document Type
Technical Report
Publication Date
Dec 29, 1989
Accession Number
ADA217596

Entities

People

  • Barry G. Wahlig
  • David M. Walker
  • Jim G. Gillespie

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Charge Carriers
  • Compound Semiconductors
  • Computers
  • Crystal Lattices
  • Detection
  • Detectors
  • Electric Fields
  • Electromagnetic Fields
  • Electromagnetic Radiation
  • Electromagnetic Scattering
  • Electronics
  • Energy Bands
  • Gamma Rays
  • Ionization
  • Measurement
  • Scattering
  • Semiconductors

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Nuclear and Radiation Engineering.
  • Seismology

Technology Areas

  • Microelectronics