NRL Hybrid Reliability. Physics of Failure Initial Study

Abstract

The objective of this program was to identify the failure mechanisms associated with the thermal cycling of HgCdTe hybrid infrared focal plane arrays from room temperatures to cryogenic temperature (typically 77K). This work included evaluating the possible occurrence of damage (increased dislocation density, fracturing, etc.) in the HgCdTe as a result of the hybridization process and/or cycling. Infrared focal-plane arrays (IRFPAs) are hybrid structures consisting of a HgCdTe infrared-sensitive material subdivided into an array of photodiodes and connected, via a matrix of indium interconnects or bumps, to a silicon readout used to collect the charge generated in the HgCdTe as a result of the IR signal. The readout output can be used to generate an IR image. There is a concern in the IR community that the long-term reliability of IRFPAs may be in question due to defects being formed as a result of the hybridization process and/or thermal cycling of the arrays from room to cryogenic temperatures.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1990
Accession Number
ADA217986

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms

DTIC Thesaurus Topics

  • Creep
  • Creep Tests
  • Detectors
  • Electron Microscopes
  • Electron Microscopy
  • Failure Mode And Effect Analysis
  • Focal Plane Arrays
  • Focal Planes
  • Gray Scale
  • Hydroxides
  • Material Degradation Processes
  • Materials
  • Microscopy
  • Pull Tests
  • Test And Evaluation
  • Test Methods
  • X Rays

Fields of Study

  • Materials science

Readers

  • Image Processing and Computer Vision.
  • Integrated Circuit Design and Technology.
  • Materials Science (Mechanical Engineering).

Technology Areas

  • Directed Energy