Advanced Gas Phase Reactor for Growth of Ge sub x Si sub 1-x
Abstract
We have designed and constructed a reactor for the growth of Germanium (x) Silicon (1-x) films by the newly developed technique of Ultrahigh voltage/Chemical vapor deposition epitaxy. Films of varying germanium content have been successfully grown and characterized at temperatures as low as 577 C. Work is in progress with respect to optimization of the wafer cleaning procedure and studies of dopant incorporation and device fabrication will be initiated in the near future. Keywords: Gas phase reactors; Crystallography; Crystal growth; Germanium; Silicon; Thermochemistry; Epitaxial growth.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 30, 1989
- Accession Number
- ADA219012
Entities
People
- A. G. Milnes
- David W. Greve
Organizations
- Carnegie Mellon University