XPS Studies of Doped Polypyrrole Films

Abstract

X-ray photoelectron spectroscopy was used to characterize electropolymerized polypyrrole films doped with monomeric Perchlorate and polymeric, poly(vinylsulfonate) and poly(4-styrensulfonate) anions. Electrostatic interaction between the polymer and the incorporated anions involves the whole pyrrole ring rather than specific nitrogen heteroatom sites only. C1O4(-) counterions have a planar configuration and are incorporated parallel to the planar rings. On the other hand, the large polymeric counterions are more randomly distributed around polymeric chain. After sputtering, counterions were found to be randomly distributed along the polymer chain. The analysis of the XPS data which leads to these conclusions will be discussed.

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Document Details

Document Type
Technical Report
Publication Date
Jan 25, 1990
Accession Number
ADA219424

Entities

People

  • Katsuhiko Naoi
  • Ljiljana Atanasoska
  • William H. Smyrl’

Organizations

  • University of Minnesota

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Abstracts
  • Chemical Engineering
  • Chemistry
  • Classification
  • Conductive Polymers
  • Corrosion
  • Films
  • Materials
  • Materials Science
  • Minnesota
  • Photoelectrons
  • Polymeric Films
  • Polymers
  • Security
  • Spectroscopy
  • X Ray Photoelectron Spectroscopy
  • X Rays

Readers

  • Electrochemical Surface Science
  • Polymer Science and Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene