Failure Analysis Handbook

Abstract

Aircraft service failures of any type, from a simple rivet failure to complete engine failure, have the potential to result in loss of the aircraft and personnel. Accurate determination of the cause of the failure may yield information that will prevent similar future failures from occurring. It is helpful for the investigator to have a data base of known failure modes to draw from in forming his conclusions. The objective of this program was to update and augment the two primary Air Force failure analysis handbooks, Electron Fractography Handbook and SEM/TEM Fractography Handbook, published in 1965 and 1975, respectively, with a new 'Failure Analysis Handbook.' The new handbook includes fractography of alloys and conditions not previously covered in other handbooks. The handbook also is a guide for procedures and lists other sources of information. Keywords: Transmission electron microscopy; Scanning electron microscopy; Fracture/fatigue mechanics; Steel; Nickel alloys; Cleavage; Metallography; Decohesive rupture; Titanium alloys; Photomicrography; Military aircraft equipment failure.

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Document Details

Document Type
Technical Report
Publication Date
Aug 18, 1989
Accession Number
ADA219747

Entities

People

  • C. R. Walker
  • K. K. Starr

Organizations

  • Pratt & Whitney

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Biomedical
  • Energy and Power Technologies
  • Engineered Resilient Systems
  • Space

DTIC Thesaurus Topics

  • Chemical Analysis
  • Chemical Synthesis
  • Chemistry
  • Crystal Structure
  • Engineers
  • Failure Mode And Effect Analysis
  • Hardness
  • Lepidoptera
  • Manufacturing
  • Material Degradation Processes
  • Materials
  • Materials Engineering
  • Materials Laboratories
  • Materials Science
  • Materials Testing
  • Mechanical Working
  • Mechanics

Readers

  • Library and Information Science
  • Materials Science (Mechanical Engineering).
  • Structural Health Monitoring of Composite Structures.

Technology Areas

  • Microelectronics