Surface Physics Instrumentation
Abstract
This report describes the considerable improvements in surface physics instrumentation at the Plasma and Surface Physics Laboratory made possible grant. The following three add-on instruments were purchased: Scanning Tunneling Microscope (STM), Low Energy Electron Diffractometer (LEED), Quadrupole Mass Spectrometer (QMS). A unique design has been chosen for STM. Starting with a non-vacuum STM (Nanoscope II), a vacuum compatible STM head was designed. The head uses the Nanoscope computer and can be attached to either of our UHV chambers. All the acquired instruments have been integrated with the two surface instrumentation systems existing in the laboratory. The Surface Analysis System is equipped with Auger Electron Spectroscopy (AES), Ultra Violet Photoelectron Spectroscopy (UPS), Work Function Measuring Station and Sample Transfer System for the STM. The Ion Beam System is equipped with the Quadrupole Mass Spectrometer Ion Mass Spectroscopy used for Spectroscopy, LEED, two Ion Beam Lines and Sample Transfer System for the STM. (JHD)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 29, 1990
- Accession Number
- ADA220460
Entities
People
- Andrew E. Souzis
- Joshua Isenberg
- Milos Seidl
- Seong I. Kim
Organizations
- Stevens Institute of Technology