In-Situ Topographical Imaging of Electrode Surfaces Using High Resolution Phase-Measurement Interferometric Microscopy

Abstract

Three-dimensional topographical imaging of electrode surfaces using phase-measurement interferometric microscopy is described. Topographical measurements are based on a rapid, non-destructive optical method that provides ultrahigh vertical resolution (0.6 nm) and moderate horizontal resolution (0.5 microns). In-situ images of electrodes prepared from highly oriented pyrolytic graphite, platinum thin films, and polycrystalline iron are reported. In-situ measurement of the time-dependent growth of corrosion pits on FE in 0.1 M H2S04 is also demonstrated.

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Document Details

Document Type
Technical Report
Publication Date
Apr 10, 1990
Accession Number
ADA221021

Entities

People

  • David J. Earl
  • Harlan J. Kragt
  • Henry S. White
  • John D. Norton

Organizations

  • University of Minnesota

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Chemical Engineering
  • Chemistry
  • Electrochemical Cells
  • Electrodes
  • Engineering
  • Films
  • High Resolution
  • Image Processing
  • Materials
  • Materials Science
  • Microscopes
  • Microscopy
  • Optical Properties
  • Phase Measurement
  • Refractive Index
  • Thin Films
  • Three Dimensional

Fields of Study

  • Physics

Readers

  • Astronomy and Astrophysics.
  • Image Processing and Computer Vision.
  • Thin Film Deposition Science.