Ni Impurity Effects on Hydrogen Surface Chemistry and Etching of Si(111)

Abstract

The effect of impurity Nickel on the etching of Silicon by hydrogen chemisorption is examined in ultrahigh vacuum with Auger electron spectroscopy and temperature programmed desorption methods. It is found that a small surface concentration of Ni inhibits the production of Silane from atomic Hydrogen adsorption on the Si(111)-Ni surface. Keywords: Silane, Hydrogen, SiH4, si(111), Ni, Physical chemistry, Impurities, Metal films, AES.

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Document Details

Document Type
Technical Report
Publication Date
May 21, 1990
Accession Number
ADA222083

Entities

People

  • C. C. Cheng
  • J. T. Yates Jr.
  • P. A. Taylor
  • R. M. Wallace
  • Wolfgang J. Wolfgang J. Choyke

Organizations

  • University of Pittsburgh

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Adsorption
  • Auger Electron Spectroscopy
  • Auger Electrons
  • Chemistry
  • Desorption
  • Electron Spectroscopy
  • Films
  • Ion Bombardment
  • Measurement
  • Military Research
  • Production
  • Spectra
  • Spectrometry
  • Spectroscopy
  • Surface Chemistry
  • Transition Metals
  • Ultrahigh Vacuum

Fields of Study

  • Materials science

Readers

  • Electrochemical Engineering/ Fuel Cell Technologies
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene