Research with Scanning Tip Microscopes

Abstract

An atomic force microscope has been developed using a laser diode as the interferometer which senses the minute deflection of the force sensing tip. The system, which has been incorporated inside a commercial instrument (Digital Instruments) is capable of detecting atomic steps on graphite. The instrument is also being used to profile magnetic and electric fields on storage media and integrated circuit chips, respectively. (JG)

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Document Details

Document Type
Technical Report
Publication Date
Apr 17, 1990
Accession Number
ADA222277

Entities

People

  • Dror Sarid

Organizations

  • University of Arizona

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Amino Acids
  • Biospecimens
  • Blood Cells
  • Coordination Complexes
  • Electric Fields
  • Graphitic Materials
  • Integrated Circuits
  • Laser Diodes
  • Materials
  • Microscopes
  • Molecules
  • Scanning
  • Scientific Research
  • Semiconductors
  • Ultrahigh Vacuum
  • Vacuum Chambers

Fields of Study

  • Physics

Readers

  • Plasma Physics.
  • Research Science/Academic Research
  • Semiconductor Device Technology

Technology Areas

  • Directed Energy