An Artifact Filter for Event-Related Potentials.

Abstract

Scalp-surface recordings of event-related potentials (ERPs) are frequently contaminated by electrical artifacts. We describe a Fortran 77 computer program that examines ERP data for several types of electrical artifacts: eyeblinks, voltages spikes, large local voltages, large overall voltages, amplifier saturation effects, and dead-amplifier effects. Where possible, the program compensates the ERP data for electrooculogram artifacts by time-domain cross-regression procedures. Keywords: Performance assessment, Event-related potentials, Evoked potentials, Psychophysiology, ERP, Artifact detection, EEG, EOG, Eyeblinks, Voltage spikes, Absolute voltages, Root-mean- square voltages, RMS, Amplifier clipping, Saturation, Artifacts, Biomedical instrumentation. (JG)

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1990
Accession Number
ADA223900

Entities

People

  • R. R. Stanny
  • S. J. Lacour

Organizations

  • Naval Aerospace Medical Research Laboratory

Tags

Communities of Interest

  • Biomedical

DTIC Thesaurus Topics

  • Algorithms
  • Amplifiers
  • Artifacts
  • Biomedical Research
  • Compilers
  • Computer Programs
  • Computers
  • Control Systems
  • Data Sets
  • Detection
  • Electrodes
  • Eye
  • Eye Movements
  • Frequency
  • Procedures (Computers)
  • Saturation
  • Standards

Readers

  • Brain and Cognitive Science; Experimental Psychology; Cognitive Neuroscience
  • Electronics Engineering

Technology Areas

  • Biotechnology