Backscatter Signature Generator for OTDR Calibration
Abstract
This paper describes an active characterization technique that generates backscatter signatures to measure the performance of optical time- domain reflectometers (OTDRs). These signatures can be used to test an OTDR's loss accuracy dynamic range, spatial resolution, loss resolution, and receiver recovery time. Keywords: Metrology, Calibration, Logistics, Electronic devices, Components subsystem system.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1990
- Accession Number
- ADA224606
Entities
People
- Chun Hui
- Ken Yamada
- Neil Kamikawa