Simple Approximation for Effect of Alloying on the Phenomenological Linewidth Gamma
Abstract
The physical significance is studied of the parameter Gamma which can be obtained by Electrolyte Electroreflectance (EER) or by spectroscopic ellipsometry. Results: The generalized theory of electroreflectance (which has been carried out under separate funding) has permitted us to reconcile the Gamma obtained by electroreflectance to the Gamma obtained by ellipsometry. However, it does remain that the value of Gamma obtained either way can be as high as 120 meV as compared to the expected 70 meV. This is due to the breakdown of the virtual crustal assumption and is in fact a quantitative measure of it. It turns out that the measured Gamma sub m = Gamma sub 0 + kT + Delta Gamma where Gamma sub m is the measured linewidth, Gamma sub 0 is the expected 70 meV and Delta Gamma measures the departure from the virtual crystal approximation. Electrolyte electroreflectance.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1983
- Accession Number
- ADA224830
Entities
People
- Paul M. Raccah
Organizations
- University of Illinois Urbana–Champaign