Analysis of Scanning Tunneling Microscope Topographs of Graphite Surfaces Roughened by Ar(+) Ion Bombardment

Abstract

The scanning tunneling microscope (STM) has been used to investigate graphite surfaces roughened by 5 ke V Ar+ion bombardment. The (0001) surfaces of several samples were etched with the same total ion dose but with different sputter rates for each surface. STM images taken after sputtering show that the roughness of the sputtered surfaces depended on the sputter rate and that the surface topography of each sample appeared self-similar over a large range of length scales. These experimental observations agree with predictions of the recently proposed Shadow Model. The two dimensional height-height correlation function is utilized as a means of quantitative analysis for STM topographs of sputtered surfaces. (JES)

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1990
Accession Number
ADA225037

Entities

People

  • Elliott A. Eklund
  • Eric J. Snyder
  • R. Stanley Williams

Organizations

  • University of California, Los Angeles

Tags

Communities of Interest

  • Counter IED
  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Biochemistry
  • California
  • Chemistry
  • Classification
  • Computer Simulations
  • Computers
  • Data Analysis
  • Graphitic Materials
  • Ion Beams
  • Materials
  • Military Research
  • Shot Noise
  • Simulations
  • Surface Roughness
  • Two Dimensional
  • United States
  • Universities

Fields of Study

  • Physics

Readers

  • Thin Film Deposition Science.