Rapid Isothermal Processing of the Thin Epitaxial CaF2 Dielectric Films for Advanced Si Radiation Tolerant Integrated Circuits
Abstract
This report contains research results in the areas of in-situ rapid isothermal processing, in-situ cleaning of semiconductor surfaces, solid phase epitaxial growth of II-A fluorides, in-situ metallization, the role of thermal stress, use of II-A fluorides as buffer layers for the decomposition of high temperature superconducting thin films and the set up of RIP assisted MOCVD. Keywords: Dielectric films, Integrated circuits, Isothermal processing, Semiconductors, fluorides, Metallization, Thermal stress, Superconducting thin films.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1990
- Accession Number
- ADA225995
Entities
People
- Rajendra Singh
Organizations
- University of Oklahoma