Growth, Physical Properties, and Device Characteristics of Hg(1-x)Mn(x) Te and Hg(1-x-y)Cd(y)Mn(x)Te Epilayers
Abstract
The original aims of this research program were: (1) To develop techniques for reproducible growth of device quality HG(1-x)Mn(x) and Hg(1-x-y) Cd(y)Mn(x)Te epitaxial layers with controlled carrier concentration and alloy composition in the range 0<x<0.2, and (2) To measure transport, optical, and other physical properties of the samples grown.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1988
- Accession Number
- ADA226507
Entities
People
- P. A. Wolff
Organizations
- Massachusetts Institute of Technology