Development of an External Beam Ion Milliprobe

Abstract

The goals of this Trident Project were the design, construction, testing, and initial application of an external beam ion milliprobe at the U.S. Naval Academy. The ion milliprobe is a tool for elemental analysis that employs the 1.7 million volt tandem electrostatic accelerator in Michelson C-7 to provide a beam of charged particles. The mechanism used for the analysis of elemental concentration is particle induced x-ray emission (PIXE). This technique involves detecting and counting the x-rays produced when the focused beam of charged particles strikes the sample to be analyzed. This paper describes the design and construction of several essential specialized devices including an electrostatic quadrupole triplet lens, a current measuring collimator, an exit tip, and a sample enclosure. It discusses the procedures necessary to align, focus, and determine the size of the beam. Finally, the results of the initial analysis are evaluated and presented.

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Document Details

Document Type
Technical Report
Publication Date
May 22, 1990
Accession Number
ADA227247

Entities

People

  • Stephan A. Maclaren

Organizations

  • United States Naval Academy

Tags

Communities of Interest

  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Charged Particles
  • Chemical Elements
  • Chemistry
  • Collimators
  • Compound Semiconductors
  • Computer Programs
  • Computers
  • Detectors
  • Electric Fields
  • Ion Beams
  • Measurement
  • Power Supplies
  • Scattering
  • United States
  • United States Naval Academy
  • Vacuum Chambers
  • X Rays

Fields of Study

  • Physics

Readers

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