Latest Trends in Parts SEP Susceptibility from Heavy Ions

Abstract

An ongoing single-event phenomena (SEP) test program is continuing, in order to assess specific parts performance for interplanetary and satellite environments and to establish trends in single-event upset (SEU) response of an ever-increasing body of device data. The data are collected according to technology, function, and manufacturer in order to permit trends, generalizations, and data gaps to be identified. This is a third set of heavy ion single event phenomena (SEP) test data. Trends in SEP susceptibility (e.g., soft errors and latchup) for state-of-the-art parts are presented.

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Document Details

Document Type
Technical Report
Publication Date
Sep 30, 1990
Accession Number
ADA228752

Entities

People

  • D. K. Nichols
  • G. A. Soli
  • L. S. Smith
  • Rokutano Koga
  • W. A. Kolasinski

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Artificial Satellites
  • Chemical Kinetics
  • Chemistry
  • Complementary Metal-Oxide Semiconductors
  • Electronics Industry
  • Electronics Laboratories
  • Jet Propulsion
  • Large Scale Integration
  • Materials
  • Materials Science
  • Metal Oxide Semiconductors
  • Physics Laboratories
  • Security
  • Semiconductor Devices
  • Semiconductors
  • Space Sciences
  • Space Systems

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Naval Mine Countermeasure Systems Development.
  • Systems Analysis and Design

Technology Areas

  • Space