A Computer Program for Measuring Fibers with the ZEISS CSM 950 Scanning Electron Microscope

Abstract

A computer program designed for the stereological measurement of fibers was written for use with a ZEISS CSM 950 Scanning Electron Microscope (SEM). This program utilized the ZEISS' build-in Kontron Image Analyzer to access measurements of a variety of parameters for fiber analysis of images from a video camera, light microscope or SEM. The program was written to permit interaction between the menu program displayed on the TV monitor and the keyboard or mouse. This increased capability permits the operator to change parameters within the measurement program depending on the type of fiber sample. Since research presently being conducted in these laboratories on ballistic fibers, including biotechnologically derived fibers, requires information about fiber size, shape, etc., developing a menu-oriented computer program facilitates that purpose.

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1990
Accession Number
ADA229952

Entities

People

  • Deborah Sakelakos
  • Samuel H. Cohen

Organizations

  • United States Army Soldier Systems Center

Tags

Communities of Interest

  • Cyber
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Analyzers
  • Cameras
  • Classification
  • Computer Programs
  • Computers
  • Electron Microscopes
  • Electrons
  • Image Processing
  • Instructions
  • Mathematics
  • Measurement
  • Microscopes
  • Scanning
  • Scanning Electron Microscopes
  • Security
  • Statistical Analysis
  • Statistical Data

Fields of Study

  • Physics

Readers

  • Computer Science.
  • Image Processing and Computer Vision.
  • Nanoscale Plasmonic Nanotechnology

Technology Areas

  • Biotechnology
  • Microelectronics
  • Microelectronics - Microelectromechanical Systems